Doping Mechanism Of Pure Nitric Oxide In Tungsten Diselenide Transistors (Purdue, MIT, NYCU)

A technical paper titled “Uncovering the doping mechanism of nitric oxide in high-performance P-type WSe2 transistors” was published by researchers at Purdue University, MIT and National Yang Ming Chiao Tung University (with support from Intel Corporation).

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The Evolution of Power Electronics in E-mobility  Powertrain Applications

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Optimization Approach For The Dispensing of Thermal Interface Material (KIT, Robert Bosch)